DARPA - Microsystems Technology Office (MTO): Advanced Sources for Single-event Effects Radiation Testing (ASSERT))- Abstracts

Electronics | Energy | Materials | Microsystems |

The Advanced Sources for Single event Effects Radiation Testing (ASSERT) program will develop new capabilities for single-event effect (SEE) testing of 3D heterogeneously integrated (3DHI) electronic components and circuits. These capabilities will transform the current radiation-hardened electronics design and development process, resulting in the rapid deployment of next generation electronics to space and strategic warfighters. Key program goals include the generation of energetic particles with penetration depths of up to 5 mm in silicon with high-radiation-relevant linear energy transfers (LETs) and beam diameters < 0.2 µm.

https://sam.gov/opp/f4f70aefb2ee4586a9cfdd46a78faee1/view#general